By Robert L. Snyder (auth.), Camden R. Hubbard, Charles S. Barrett, Paul K. Predecki, Donald E. Leyden (eds.)
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Extra info for Advances in X-Ray Analysis: Volume 26
EXPERIMENTAL METHOD The data were collected by step scanning with a computer controlled diffractometer (1,2) and the intensities determined by the profile fitting method (2,3). 5 0 (none in diffracted beam), curved graphite monochromator after receiving slit, vacuum path, and scintillation counter with pulse amplitude discrimination. SPECIMEN PREPARATION The preparation of satisfactory specimens is a very important factor in determining the accuracy of the intensities. It is a difficult art and needs considerably more development.
The crystallite size effect can be observed by rotating the specimen around the axis normal to the center of the specimen surface while the diffractometer is set at the peak position, and recording the intensity on a strip chart, Fig. 2. The short intensity 39 W. PARRISH AND T. C. HUANG Table 1. J. 3 lines to the right of each recording are the averages of the intensities at all azimuths with fast (60 rpm) rotation. The small wiggles result only from counting statistics. The numbers are the chart amplitudes and scaling to the highest= 100, the (111) relative peak intensities were <5 I'm=95, 5-10=100, 10-20=94, 20-30=88 and >30=59.
Huang and G. L. , IBM Research Report RJ 3524 (41681), June 12, 1982 3. W. Parrish and T. C. Huang, Accuracy of the Profile Fitting Method for X-Ray Polycrystallite Diffractometry, Symp. on Accuracy in Powder Diffraction, in: Nat. Bur. Stand. Spec. Pub. 457, 95-110. 4. W. Parrish, "X-Ray Analysis Papers," Centrex Publ. , Eindhoven (1965). 5. P. M. DeWolff, J. Taylor and W. Parrish, Experimental Study of Effect of Crystallite Size Statistics on X-Ray Diffractometer Intensities, Journal ~ Phys. 30:63-69 (1959).
Advances in X-Ray Analysis: Volume 26 by Robert L. Snyder (auth.), Camden R. Hubbard, Charles S. Barrett, Paul K. Predecki, Donald E. Leyden (eds.)